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Semiconductor
1155 East Collins Blvd.
- IP Network Analyzers
- Vector Network Measurement Systems - Spectrum Analyzers - Signal Generators - Signal Generators - Bit Error Rate Testers (BERT's) - Optical Test Instruments - Hand Held Measuring Instruments
6920 Seaway Blvd.
360 Foothill Road
- Emission Microscopy Systems
- Frontside and Backside Inspection - Wafer Package Preperation Systems - Inverted Emission Microscopy Systems
3000 Laurelview Court
- Wafer Level Probe Cards
- CantileverProduction Probe Cards - Multi-Die Fine Pitch Probe Cards - Vertical High Parallel Probe Cards
1-800-548-8911
14150 SW Karl Braun Dr.
384 Pine Street
- OmniEtch bare die delayering system
- JetEtch decapsulation system
2601 Texas Drive
- World Leader in Reliability Test Sockets
- Largest product offering for QFN and Dual Row QFN - BGA down to 0.5mm pitch - Memory Sockets including DDRII & DDRIII - H-pin technology: 6 amp upto 200C with 0.9mm compliance!
405 Essex Road
- AC/DC Calibrators, Oscillocope Calibrators
- MET/CAL - DMM, Arbitrary Waveform Generators, Data Acquisition Systems, Counter/Timers - Electrical Power Standard/Calibrator Transfer Standards - RF Reference Source
- Programmable DC Power Supplies (6V to 600V) for System and ATE Applications
- Digital Oscilloscopes
631 Montague St
- Global leader in design and manufacturing of Semi-conductor test interface products
- High performance test sockets - Failure analysis test sockets - Semi-custom burn-in sockets - Test probes, socket savers, custom adapters and DUT boards
47613 Warm Springs Blvd.
- Burn-in Systems; turn key solutions and retrofiting existing systems with drivers and software
- Driver Boards - Burn in Boards (BIB's) - ATE Services for the V1000/1100/2100, HP82000, HP9470/9472/9473 and HP4062 - ATE System sales for i9470/9472 (formely the HP9400 series tester)
12011 Mosteller
- Environmental Test Chambers
- Benchtop Chamber - Temperature and Humidity Chamber - Walk-in and Drive-in Chambers - Altitude, Vibration, Liquid and Thermal Shock Chambers
1228 North Stadem Drive
- Probilt probe card analyzers and repair stations: Manual to fully automatic
- Ergonomic analyzers with greatest measurement resolution, highest throughput and most flexibility - Probe analyzers dedicated to incoming quality control and repair for cantilever, vertical and MEM's probe card technology
2149 E. Pratt Blvd.
- Non-Destructive internal Failure Analysis Inspection and analysis using Acoustic Microscopy and Acoustic Micro Imaging (AMI) technology
- GEN5 Series: Delivers the broadest range of capabilities and the most advanced features. - D24 Series: 24” x 24” scanning area perfectly suited for large area samples, component inspection on PC boards and multiple JEDEC trays - D9000 Series: Ideal for failure analysis, process development and material characterization. - AW200 Series: Automatically handles, inspects and sorts bonded wafers - SonoLab services: Materials Characterization and Qualification, High-Capacity Screening and Lot Reclamation, Failure Analysis, Inspection and Audit Services and Training |